Facilities and expertise

We will provide our facilities, service and expertise to support your research.

Facilities

The main capabilities of our unique in-house developed HS-LEIS analytical systems are:

• Accurate quantitative measurement of surface coverage and atomic composition of the outermost atomic layer
• Depth analysis with extreme resolution up to a depth of 10 nm

Also, various options for pre-treatment and analysis dedicated to your application are available. These include charge compensation for insulators, sample heating in a special atmosphere, and secondary electron imaging.