At our LEIS competence centre we perform consultancy and service analysis on our newest HS-LEIS systems. The systems have an in-built XPS capability to take full advantage of the complementarity of LEIS and XPS. Pre-treatment facilities (gases, heating) are available.
Outcome of analysis:
- Surface coverage and atomic composition of the outermost atomic layer
- Depth analysis with extreme depth resolution up to a depth of 10 nm
- Quantitative information at the atomic level
- Variety of materials including powders, insulators and rough samples
- Real systems in real conditions and in real time
- Extreme sensitivity:
10 ppm for heavy elements, a few % for light elements
- Analysis at elevated temperatures (up to 1200°C/2200°F).
The analysis is fast and, if needed, we can provide conclusive results on a given sample within a day.
Calipso serves many of the leading companies in the area of catalysts, semiconductors, polymers and ceramics. See for concrete examples the section Applications.
All our work is performed in strictest confidence. It is even possible for a client to perform measurements personally, so secrecy is absolutely guaranteed. Calipso strives to achieve total client satisfaction, therefore, both the analysis and the report are tailor-made according to the customer’s demands.
Contact us for a project quotation.