Calipso Expertise Center

If you need to know what's really on the surface

Bringing nano-technology into products asks for new characterisation technologies. Calipso’s High-Sensitivity Low Energy Ion Scattering (HS-LEIS) surface analysis technology is the only technique in the world capable of analysing the outermost atomic layer of a substrate.

We provide analytical services for many applications like catalysis, ALD growth, coatings, polymers, SAM’s, metal-polymer interface, implants and many others.

News:
Introduction of Qtac¹⁰⁰, the next generation of HS-LEIS instruments